Share Email Print
cover

Proceedings Paper

Surface science applied to lasers: near-field optical microscopy
Author(s): Steve K. Buratto; Julia W. P. Hsu; Lisa Dhar; R. B. Byslma; Charles C. Bahr; Mark J. Cardillo
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

Near-field scattering optical microscopy (NSOM) is used to characterize the emission output and to obtain photoconductivity maps of InGaAsP multiple quantum well lasers. The high spatial resolution of NSOM (approximately (lambda) /20) allows detailed imaging of the laser structure. Emission measurements not only provide direct visualization of the laser mode but also reveal unwanted emission due to InP electroluminescence. Near-field photoconductivity experiments yield high resolution measurement of carrier transport throughout the structure yielding valuable information on current leakage, defect formation, and the quality of p-n junctions.

Paper Details

Date Published: 25 September 1995
PDF: 6 pages
Proc. SPIE 2547, Laser Techniques for Surface Science II, (25 September 1995); doi: 10.1117/12.221498
Show Author Affiliations
Steve K. Buratto, AT&T Bell Labs. (United States)
Julia W. P. Hsu, AT&T Bell Labs. (United States)
Lisa Dhar, AT&T Bell Labs. (United States)
R. B. Byslma, AT&T Bell Labs. (United States)
Charles C. Bahr, AT&T Bell Labs. (United States)
Mark J. Cardillo, AT&T Bell Labs. (United States)


Published in SPIE Proceedings Vol. 2547:
Laser Techniques for Surface Science II
Janice M. Hicks; Wilson Ho; Hai-Lung Dai, Editor(s)

© SPIE. Terms of Use
Back to Top