Share Email Print
cover

Proceedings Paper

Terahertz metrology on power, frequency, spectroscopy, and pulse parameters
Author(s): Bin Wu; Cheng Ping Ying; Heng Fei Wang; Peng Zhang; Hong Yuan Liu; Bin Jiang
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

Terahertz metrology is becoming more and more important along with the fast development of terahertz technology. This paper reviews the research works of the groups from the physikalisch-technische bundesanstalt (PTB), National institute of standards and technology (NIST), National physical laboratory (NPL), National institute of metrology (NIM) and some other research institutes. The contents mainly focus on the metrology of parameters of power, frequency, spectrum and pulse. At the end of the paper, the prospect of terahertz metrology is predicted.

Paper Details

Date Published: 5 November 2015
PDF: 7 pages
Proc. SPIE 9795, Selected Papers of the Photoelectronic Technology Committee Conferences held June–July 2015, 97953L (5 November 2015); doi: 10.1117/12.2214929
Show Author Affiliations
Bin Wu, The 41st Institute of China Electronics Technology (China)
Cheng Ping Ying, China Electronics Technology Group Corp. (China)
Heng Fei Wang, China Electronics Technology Group Corp. (China)
Peng Zhang, The 41st Institute of China Electronics Technology (China)
Hong Yuan Liu, China Electronics Technology Group Corp. (China)
Bin Jiang, China Electronics Technology Group Corp. (China)


Published in SPIE Proceedings Vol. 9795:
Selected Papers of the Photoelectronic Technology Committee Conferences held June–July 2015
Shenggang Liu; Songlin Zhuang; Michael I. Petelin; Libin Xiang, Editor(s)

© SPIE. Terms of Use
Back to Top