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Proceedings Paper

Development of large area nanostructured antireflection coatings for EO/IR sensor applications
Author(s): Ashok K. Sood; Gopal Pethuraja; Roger E. Welser; Yash R. Puri; Nibir K. Dhar; Priyalal S. Wijewarnasuriya; Jay Lewis; Harry Efsthadiatis; Pradeep Haldar; E. Fred Schubert
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Paper Abstract

Electro-optical/infrared sensors are being developed for a variety of defense and commercial systems applications. One of the critical technologies that will enhance EO/IR sensor performance is the development of advanced antireflection coatings with both broadband and omnidirectional characteristics. In this paper, we review our latest work on high quality nanostructure-based antireflection structures, including recent efforts to deposit nanostructured antireflection coatings on large area substrates. Nanostructured antireflection coatings fabricated via oblique angle deposition are shown to enhance the optical transmission through transparent windows by minimizing broadband reflection losses to less than one percent, a substantial improvement over conventional thin-film antireflection coating technologies. Step-graded antireflection structures also exhibit excellent omnidirectional performance, and have recently been demonstrated on 6-inch diameter substrates.

Paper Details

Date Published: 28 August 2015
PDF: 10 pages
Proc. SPIE 9609, Infrared Sensors, Devices, and Applications V, 96090D (28 August 2015); doi: 10.1117/12.2214877
Show Author Affiliations
Ashok K. Sood, Magnolia Optical Technologies, Inc. (United States)
Gopal Pethuraja, Magnolia Optical Technologies, Inc. (United States)
Roger E. Welser, Magnolia Optical Technologies, Inc. (United States)
Yash R. Puri, Magnolia Optical Technologies, Inc. (United States)
Nibir K. Dhar, U.S. Army Night Vision & Electronic Sensors Directorate (United States)
Priyalal S. Wijewarnasuriya, U.S. Army Research Lab. (United States)
Jay Lewis, Defense Advanced Research Projects Agency (United States)
Harry Efsthadiatis, College of Nanoscale Science and Engineering (United States)
Pradeep Haldar, College of Nanoscale Science and Engineering (United States)
E. Fred Schubert, Rensselaer Polytechnic Institute (United States)

Published in SPIE Proceedings Vol. 9609:
Infrared Sensors, Devices, and Applications V
Paul D. LeVan; Ashok K. Sood; Priyalal Wijewarnasuriya; Arvind I. D'Souza, Editor(s)

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