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Proceedings Paper

Evaluation of 8 x 8 reverse-etched avalanche photodiode arrays for oceanographic lidar systems
Author(s): David M. Allocca; V. Michael Contarino; Martin F. Squicciarini; R. I. Billmers
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Paper Abstract

Testing has been conducted on 8 by 8 avalanche photo diode (APD) arrays derived from large area (16 mm) APDs, both produced by Advanced Photonics, Inc. The array structure was produced using a novel reverse etching process. Tests have been conducted measuring cross- talk, bandwidth, rise and fall times, gain, effective pixel size, and noise characteristics. Measurements have been made as functions of wavelength, optical intensity, and bias voltage. Cross-talk between pixels was characterized under both CW and pulsed (3 nsec) conditions. The effective pixel size was measured by scanning a very small laser spot (.25 mm) across the pixel under test while monitoring the output current. The measured pixel size was approximately 1 mm. This matched very well with the expected physical pixel size of 1 mm. The pulse response was measured by injecting a 3 nsec laser pulse into the pixel under test. The measured response shows that the signal decays approximately 3 orders of magnitude in 60 nsec. The rise time of the pixel is on the order of 5 nsec. Cross-talk between pixels was measured by injecting an optical signal into a pixel. The current output of an adjacent pixel was measrued as the optical power input was increased. The cross-talk a CW optical input is on the order of 1000 to 1. The pulsed cross-talk is on the order of 100 to 1. The cross talk ratio remains constant with varying optical input intensities. The pulsed wavelength response of the APD was characterized at 440 nm and 700 nm. The APD exhibited no difference between the two wavelengths.

Paper Details

Date Published: 26 September 1995
PDF: 6 pages
Proc. SPIE 2550, Photodetectors and Power Meters II, (26 September 1995); doi: 10.1117/12.221425
Show Author Affiliations
David M. Allocca, AMPAC Inc. (United States)
V. Michael Contarino, Naval Air Warfare Ctr. (United States)
Martin F. Squicciarini, Naval Air Warfare Ctr. (United States)
R. I. Billmers, Naval Air Warfare Ctr. (United States)


Published in SPIE Proceedings Vol. 2550:
Photodetectors and Power Meters II
Kathleen Muray; Kenneth J. Kaufmann, Editor(s)

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