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Proceedings Paper

Characterization of dynamic channel resistance of GaN-based HEMTs
Author(s): Jen-Inn Chyi; Yue-Ming Hsin; Wen-Chia Liao; Wei-Hsin Kao; Hsing-Ching Pan; Geng-Yen Lee
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Proc. SPIE 9748, Gallium Nitride Materials and Devices XI, 974829; doi: 10.1117/12.2214144
Show Author Affiliations
Jen-Inn Chyi, National Central Univ. (Taiwan)
Yue-Ming Hsin, National Central Univ. (Taiwan)
Wen-Chia Liao, National Central Univ. (Taiwan)
Wei-Hsin Kao, National Central Univ. (Taiwan)
Hsing-Ching Pan, National Central Univ. (Taiwan)
Geng-Yen Lee, National Central Univ. (Taiwan)


Published in SPIE Proceedings Vol. 9748:
Gallium Nitride Materials and Devices XI
Jen-Inn Chyi; Hiroshi Fujioka; Hadis Morkoç; Yasushi Nanishi; Ulrich T. Schwarz; Jong-In Shim, Editor(s)

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