Share Email Print
cover

Proceedings Paper

Optical tweezers and surface plasmon resonance combination system based on the high numerical aperture lens
Author(s): Xuchen Shan; Bei Zhang; Guoqiang Lan; Yiqiao Wang; Shugang Liu
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

Biology and medicine sample measurement takes an important role in the microscopic optical technology. Optical tweezer has the advantage of accurate capture and non-pollution of the sample. The SPR(surface plasmon resonance) sensor has so many advantages include high sensitivity, fast measurement, less consumption of sample and label-free detection of biological sample that the SPR sensing technique has been used for surface topography, analysis of biochemical and immune, drug screening and environmental monitoring. If they combine, they will play an important role in the biological, chemical and other subjects. The system we propose use the multi-axis cage system, by using the methods of reflection and transmiss ion to improve the space utilization. The SPR system and optical tweezer were builtup and combined in one system. The cage of multi-axis system gives full play to its accuracy, simplicity and flexibility. The size of the system is 20 * 15 * 40 cm3 and thus the sample can be replaced to switch between the optical tweezers system and the SPR system in the small space. It means that we get the refractive index of the sample and control the particle in the same system. In order to control the revolving stage, get the picture and achieve the data stored automatically, we write a LabVIEW procedure. Then according to the data from the back focal plane calculate the refractive index of the sample. By changing the slide we can trap the particle as optical tweezer, which makes us measurement and trap the sample at the same time.

Paper Details

Date Published: 5 November 2015
PDF: 6 pages
Proc. SPIE 9795, Selected Papers of the Photoelectronic Technology Committee Conferences held June–July 2015, 97950Z (5 November 2015); doi: 10.1117/12.2214050
Show Author Affiliations
Xuchen Shan, Heilongjiang Univ. (China)
Bei Zhang, BeiHang Univ. (China)
Guoqiang Lan, Heilongjiang Univ. (China)
Yiqiao Wang, Heilongjiang Univ. (China)
Shugang Liu, Heilongjiang Univ. (China)


Published in SPIE Proceedings Vol. 9795:
Selected Papers of the Photoelectronic Technology Committee Conferences held June–July 2015
Shenggang Liu; Songlin Zhuang; Michael I. Petelin; Libin Xiang, Editor(s)

© SPIE. Terms of Use
Back to Top