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Proceedings Paper

Integrated optoelectronic waveguide detectors in SiGe for optical communications
Author(s): Armin O. Splett; Thomas Zinke; Berndt Schueppert; Klaus Petermann; Horst Kibbel; Hans-Joest Herzog; Hartmut Presting
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Paper Abstract

The monolithic integration of a SiGe-optical waveguide with a detector based on SiGe- absorbing layers is presented. A maximum internal quantum efficiency of (eta) equals 40% has been measured at (lambda) equals 1.3 micrometers , which corresponds to an external efficiency of (eta) equals 11%. This device is suitable for 2.5 GBit/s data transmission, the performance is limited by the RC time constant due to a capacitance of C equals 1.7 pF.

Paper Details

Date Published: 26 September 1995
PDF: 11 pages
Proc. SPIE 2550, Photodetectors and Power Meters II, (26 September 1995); doi: 10.1117/12.221403
Show Author Affiliations
Armin O. Splett, Technische Univ. Berlin (Germany)
Thomas Zinke, Technische Univ. Berlin (Germany)
Berndt Schueppert, Technische Univ. Berlin (Germany)
Klaus Petermann, Technische Univ. Berlin (Germany)
Horst Kibbel, Daimler Benz Forschungsinstitut (Germany)
Hans-Joest Herzog, Daimler Benz Forschungsinstitut (Germany)
Hartmut Presting, Daimler Benz Forschungsinstitut (Germany)


Published in SPIE Proceedings Vol. 2550:
Photodetectors and Power Meters II
Kathleen Muray; Kenneth J. Kaufmann, Editor(s)

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