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Proceedings Paper

Analysis of high voltage dielectric insulation materials of XLPE by THz-TDS system
Author(s): Wei Shi; Zhijin Yan; Lei Yang; Yang Dai; Like Zhang; Kangkang Bian; Lei Hou
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Paper Abstract

In this paper, cross-linked polyethylene (XLPE) was analyzed by THz time domain spectroscopy (TDS) system at room temperature. By recording time domain signal of terahertz radiation field, frequency spectrum can be obtained by Fourier transform. Then the refractive index and dielectric constant in THz band are calculated. This proves that the THz-TDS system has a potential application for detecting the aging characteristic of XLPE.

Paper Details

Date Published: 5 November 2015
PDF: 5 pages
Proc. SPIE 9795, Selected Papers of the Photoelectronic Technology Committee Conferences held June–July 2015, 97953G (5 November 2015); doi: 10.1117/12.2213823
Show Author Affiliations
Wei Shi, Xi'an Univ. of Technology (China)
Zhijin Yan, Xi'an Univ. of Technology (China)
Lei Yang, Xi'an Univ. of Technology (Chile)
Yang Dai, Xi'an Univ. of Technology (China)
Like Zhang, Xi'an Univ. of Technology (China)
Kangkang Bian, Xi'an Univ. of Technology (China)
Lei Hou, Xi'an Univ. of Technology (China)


Published in SPIE Proceedings Vol. 9795:
Selected Papers of the Photoelectronic Technology Committee Conferences held June–July 2015
Shenggang Liu; Songlin Zhuang; Michael I. Petelin; Libin Xiang, Editor(s)

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