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Proceedings Paper

Atom-based RF electric field metrology above 100 GHz
Author(s): Matt T. Simons; Joshua A. Gordon; Christopher L. Holloway
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Paper Abstract

Atom-based radio-frequency (RF) electric field probes have the potential to improve electric field measurements for a broad range of frequencies (from a few GHz to 100s of GHz) and field strengths (mV/m to kV/m). For these probes to become a common measurement method, their range must be extended to high frequency (>100 GHz) and low field strength regimes. We present SI-traceable electric field measurements of RF fields above 100 GHz, using Autler-Townes splitting of Rydberg electromagnetically-induced transparency in a rubidium (Rb) vapor. We also demonstrate several techniques, including RF detuning from resonance and enhanced absorption, for increasing the probe sensitivity.

Paper Details

Date Published: 25 February 2016
PDF: 7 pages
Proc. SPIE 9747, Terahertz, RF, Millimeter, and Submillimeter-Wave Technology and Applications IX, 97471F (25 February 2016); doi: 10.1117/12.2213415
Show Author Affiliations
Matt T. Simons, National Institute of Standards and Technology (United States)
Joshua A. Gordon, National Institute of Standards and Technology (United States)
Christopher L. Holloway, National Institute of Standards and Technology (United States)


Published in SPIE Proceedings Vol. 9747:
Terahertz, RF, Millimeter, and Submillimeter-Wave Technology and Applications IX
Laurence P. Sadwick; Tianxin Yang, Editor(s)

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