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Proceedings Paper

AlGaInP red-emitting light emitting diode under extremely high pulsed pumping
Author(s): Amit Yadav; Ilya E. Titkov; Grigorii S. Sokolovskii; Sergey Yu. Karpov; Vladislav V. Dudelev; Ksenya K. Soboleva; Martin Strassburg; Ines Pietzonka; Hans-Juergen Lugauer; Edik U. Rafailov
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Paper Abstract

Efficiency of commercial 620 nm AlGaInP Golden Dragon-cased high-power LEDs has been studied under extremely high pump current density up to 4.5 kA/cm2 and pulse duration from microsecond down to sub-nanosecond range. To understand the nature of LED efficiency decrease with current, pulse width variation is used. Analysis of the pulse-duration dependence of the LED efficiency and emission spectrum suggests the active region overheating to be the major factor controlling the LED efficiency reduction at CW and sub-microsecond pumping. The overheating can be effectively avoided by the use of sub-nanosecond current pulses. A direct correlation between the onset of the efficiency decrease and LED overheating is demonstrated.

Paper Details

Date Published: 8 March 2016
PDF: 7 pages
Proc. SPIE 9768, Light-Emitting Diodes: Materials, Devices, and Applications for Solid State Lighting XX, 97681K (8 March 2016); doi: 10.1117/12.2213344
Show Author Affiliations
Amit Yadav, Aston Univ. (United Kingdom)
Ilya E. Titkov, Aston Univ. (United Kingdom)
Grigorii S. Sokolovskii, Ioffe Physical-Technical Institute (Russian Federation)
Sergey Yu. Karpov, STR Group-Soft Impact Ltd. (Russian Federation)
Vladislav V. Dudelev, Ioffe Physical-Technical Institute (Russian Federation)
Ksenya K. Soboleva, Saint-Petersburg State Polytechnical Univ. (Russian Federation)
Martin Strassburg, OSRAM Opto Semiconductors GmbH (Germany)
Ines Pietzonka, OSRAM Opto Semiconductors GmbH (Germany)
Hans-Juergen Lugauer, OSRAM Opto Semiconductors GmbH (Germany)
Edik U. Rafailov, Aston Univ. (United Kingdom)

Published in SPIE Proceedings Vol. 9768:
Light-Emitting Diodes: Materials, Devices, and Applications for Solid State Lighting XX
Heonsu Jeon; Li-Wei Tu; Michael R. Krames; Martin Strassburg, Editor(s)

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