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Proceedings Paper

Ultrafast imaging of plasmons in a transmission electron microscope
Author(s): Tom T. A. Lummen; Gabriele Berruto; Andrea Toma; Raymond J. Lamb; Damien McGrouther; Fabrizio Carbone
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Paper Abstract

Miniaturized plasmonic and photonic integrated circuits are generally considered as the core of future generations of optoelectronic devices, due to their potential to bridge the size-compatibility gap between photonics and electronics. However, as the nanoscale is approached in increasingly small plasmonic and photonic systems, experimentally observing their behavior involves ever more stringent requirements in terms of both temporal and spatial resolution. This talk focuses on the use of time-resolved Photon-Induced Near-Field Electron Microscopy (PINEM) to study the excitation, propagation, (self-)interference and dynamics of surface plasmon polaritons (SPPs) in various plasmonic nanostructures with both nanometer and ultrafast resolution in a transmission electron microscope. Using this field-ofview technique, we directly show how photo-excited plasmonic interference patterns are controlled through the combination of excitation polarization and nanostructure geometry. Moreover, we capture the propagation of the photoinduced self-interfering plasmonic wave, clearly demonstrating the effects of axial confinement in nanostructured plasmonic thin film stacks.

Paper Details

Date Published: 14 March 2016
PDF: 6 pages
Proc. SPIE 9746, Ultrafast Phenomena and Nanophotonics XX, 974610 (14 March 2016); doi: 10.1117/12.2212404
Show Author Affiliations
Tom T. A. Lummen, Ecole Polytechnique Fédérale de Lausanne (Switzerland)
Gabriele Berruto, Ecole Polytechnique Fédérale de Lausanne (Switzerland)
Andrea Toma, Istituto Italiano di Tecnologia (Italy)
Raymond J. Lamb, Univ. of Glasgow (United Kingdom)
Damien McGrouther, Univ. of Glasgow (United Kingdom)
Fabrizio Carbone, Ecole Polytechnique Fédérale de Lausanne (Switzerland)


Published in SPIE Proceedings Vol. 9746:
Ultrafast Phenomena and Nanophotonics XX
Markus Betz; Abdulhakem Y. Elezzabi, Editor(s)

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