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Proceedings Paper

Thickness measurement of tablet coating using continuous-wave terahertz reflection spectroscopy
Author(s): Nirmala Devi; Jyotirmayee Dash; Shaumik Ray; Bala Pesala
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Paper Abstract

THz rays have higher penetration depth compared to infrared rays and hence can be effectively used to measure tablet coating thickness. In addition, THz wavelength (1 mm - 0.1 mm) provides an optimal depth resolution for the thickness measurement. This method can be non-invasive and hence ideal for inline quality monitoring. Tablet coating thickness is one of the major parameters of interest in Process Analytical Technology (PAT). In this paper, a reflection mode Continuous Wave (CW) Terahertz (THz) system has been employed to measure the tablet coating thickness. A frequency scan of the sample has been carried out from 0.1 THz to 1.1 THz and the reflection coefficient of the sample is inverse fourier transformed to obtain the tablet thickness. The calculated thickness has also been validated using the optical microscope. Results show that the thickness can be measured with considerable accuracy.

Paper Details

Date Published: 25 February 2016
PDF: 8 pages
Proc. SPIE 9747, Terahertz, RF, Millimeter, and Submillimeter-Wave Technology and Applications IX, 974709 (25 February 2016); doi: 10.1117/12.2212366
Show Author Affiliations
Nirmala Devi, C.S.I.R. Madras Complex (India)
Jyotirmayee Dash, C.S.I.R. Madras Complex (India)
Shaumik Ray, C.S.I.R. Madras Complex (India)
Bala Pesala, C.S.I.R. Madras Complex (India)

Published in SPIE Proceedings Vol. 9747:
Terahertz, RF, Millimeter, and Submillimeter-Wave Technology and Applications IX
Laurence P. Sadwick; Tianxin Yang, Editor(s)

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