Share Email Print
cover

Proceedings Paper

Spatially resolved spectroscopy using swept-source optical interferometry
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

We describe principle of spatially-resolved spectroscopy using swept source optical interferometry and demonstrate it using a multi-layered polypropylene and glass plates piled sample. The advantages of this technique compared to conventional spectroscopy technique are realizing spatially-resolved spectroscopy as transmittance spectra of each layer and obtaining tomographic image of the sample simultaneously. Moreover, potential for spectroscopy is the method we propose can calculate absorption coefficient of each mediums. In this demonstration, we could 1D tomographic image of multi-layered sample and characterize PP layer and glass layer by comparing transmittance spectra in near infrared region.

Paper Details

Date Published: 15 March 2016
PDF: 6 pages
Proc. SPIE 9754, Photonic Instrumentation Engineering III, 975407 (15 March 2016); doi: 10.1117/12.2212228
Show Author Affiliations
Ryoma Onita, Saitama Univ. (Japan)
Tatsutoshi Shioda, Saitama Univ. (Japan)


Published in SPIE Proceedings Vol. 9754:
Photonic Instrumentation Engineering III
Yakov G. Soskind; Craig Olson, Editor(s)

© SPIE. Terms of Use
Back to Top