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Proceedings Paper

Calibration standards and measurement accuracy of absolute electroluminescence and internal properties in multi-junction and arrayed solar cells
Author(s): Masahiro Yoshita; Lin Zhu; Changsu Kim; Toshimitsu Mochizuki; Tetsuya Nakamura; Mitsuru Imaizumi; Shaoqiang Chen; Hidehiro Kubota; Yoshihiko Kanemitsu; Hidefumi Akiyama
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Paper Abstract

We developed methodologies and calibration standards for absolute electroluminescence (EL) measurements for CONTACT-LESS evaluation of various internal properties of multi-junction and arrayed solar cells, such as open-circuit voltages, external and internal radiative efficiencies, and luminescence-coupling efficiency. Several independent calibration methods were compared that used: 1) a calibrated EL imaging system, 2) proximity measurement with a large-area photodiode, 3) an integrating-sphere system, and 4) planar light-emitting diodes with a circular aperture. The comparison clarified the advantages and disadvantages of each method, and showed consistency within 30% uncertainty, resulting in a 7-meV uncertainty in open-circuit voltage measurements.

Paper Details

Date Published: 14 March 2016
PDF: 6 pages
Proc. SPIE 9743, Physics, Simulation, and Photonic Engineering of Photovoltaic Devices V, 97430D (14 March 2016); doi: 10.1117/12.2211726
Show Author Affiliations
Masahiro Yoshita, The Univ. of Tokyo (Japan)
Japan Science and Technology Agency (Japan)
Lin Zhu, The Univ. of Tokyo (Japan)
Japan Science and Technology Agency (Japan)
Changsu Kim, The Univ. of Tokyo (Japan)
Japan Science and Technology Agency (Japan)
Toshimitsu Mochizuki, National Institute of Advanced Industrial Science and Technology (Japan)
Tetsuya Nakamura, Japan Aerospace Exploration Agency (Japan)
Mitsuru Imaizumi, Japan Aerospace Exploration Agency (Japan)
Shaoqiang Chen, East China Normal Univ. (China)
Hidehiro Kubota, ATTO Corp. (Japan)
Japan Science and Technology Agency (Japan)
Yoshihiko Kanemitsu, Kyoto Univ. (Japan)
Japan Science and Technology Agency (Japan)
Hidefumi Akiyama, The Univ. of Tokyo (Japan)
Japan Science and Technology Agency (Japan)


Published in SPIE Proceedings Vol. 9743:
Physics, Simulation, and Photonic Engineering of Photovoltaic Devices V
Alexandre Freundlich; Laurent Lombez; Masakazu Sugiyama, Editor(s)

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