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Proceedings Paper

A method to measure and estimate normalized contrast in infrared flash thermography
Author(s): Ajay M. Koshti
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Paper Abstract

The paper presents further development in normalized contrast processing used in flash infrared thermography method. Method of computing normalized image or pixel intensity contrast, and normalized temperature contrast are provided. Methods of converting image contrast to temperature contrast and vice versa are provided. Normalized contrast processing in flash thermography is useful in quantitative analysis of flash thermography data including flaw characterization and comparison of experimental results with simulation. Computation of normalized temperature contrast involves use of flash thermography data acquisition set-up with high reflectivity foil and high emissivity tape such that the foil, tape and test object are imaged simultaneously. Methods of assessing other quantitative parameters such as emissivity of object, afterglow heat flux, reflection temperature change and surface temperature during flash thermography are also provided. Temperature imaging and normalized temperature contrast processing provide certain advantages over normalized image contrast processing by reducing effect of reflected energy in images and measurements, therefore providing better quantitative data. Examples of incorporating afterglow heat-flux and reflection temperature evolution in flash thermography simulation are also discussed.

Paper Details

Date Published: 22 April 2016
PDF: 20 pages
Proc. SPIE 9804, Nondestructive Characterization and Monitoring of Advanced Materials, Aerospace, and Civil Infrastructure 2016, 98041K (22 April 2016); doi: 10.1117/12.2211676
Show Author Affiliations
Ajay M. Koshti, NASA Johnson Space Ctr. (United States)


Published in SPIE Proceedings Vol. 9804:
Nondestructive Characterization and Monitoring of Advanced Materials, Aerospace, and Civil Infrastructure 2016
Tzuyang Yu; Andrew L. Gyekenyesi; Peter J. Shull; H. Felix Wu, Editor(s)

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