Share Email Print
cover

Proceedings Paper

Non-invasive detection of murals with pulsed terahertz reflected imaging system
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

Pulsed terahertz reflected imaging technology has been expected to have great potential for the non-invasive analysis of artworks. In this paper, three types of defects hidden in the plaster used to simulate the cases of defects in the murals, have been investigated by a pulsed terahertz reflected imaging system. These preset defects include a circular groove, a cross-shaped slit and a piece of “Y-type” metal plate built in the plaster. With the terahertz reflective tomography, information about defects has been determined involving the thickness from the surface of sample to the built-in defect, the profile and distribution of the defect. Additionally, three-dimensional analyses have been performed in order to reveal the internal structure of defects. Terahertz reflective imaging can be applied to the defect investigation of the murals.

Paper Details

Date Published: 5 November 2015
PDF: 6 pages
Proc. SPIE 9795, Selected Papers of the Photoelectronic Technology Committee Conferences held June–July 2015, 979534 (5 November 2015); doi: 10.1117/12.2210740
Show Author Affiliations
Minjie Yuan, Capital Normal Univ. (China)
Beijing Key Lab. for Metamaterials and Devices (China)
Wenfeng Sun, Capital Normal Univ. (China)
Beijing Key Lab. for Metamaterials and Devices (China)
Xinke Wang, Capital Normal Univ. (China)
Beijing Key Lab. for Metamaterials and Devices (China)
Jiasheng Ye, Capital Normal Univ. (China)
Beijing Key Lab. for Metamaterials and Devices (China)
Sen Wang, Harbin Institute of Technology (China)
Qunxi Zhang, Shaanxi History Museum (China)
Yan Zhang, Capital Normal Univ. (China)
Beijing Key Lab. for Metamaterials and Devices (China)


Published in SPIE Proceedings Vol. 9795:
Selected Papers of the Photoelectronic Technology Committee Conferences held June–July 2015
Shenggang Liu; Songlin Zhuang; Michael I. Petelin; Libin Xiang, Editor(s)

© SPIE. Terms of Use
Back to Top