Share Email Print
cover

Proceedings Paper

Vertical dispersion methods in x-ray spectroscopy of high-temperature plasmas
Author(s): Oldrich Renner; Thomas Missalla; Eckhart Foerster
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

General formulae for the applying the vertical dispersion principle in x-ray spectroscopy of multiply charged ions are summarized, the characteristics of the experimental schemes based on flat and bent crystals are discussed. The unique properties of the novel spectroscopic methods, i.e. their extremely high dispersion, high spectral and 1D spatial resolution, and good collection efficiency, make them very attractive for ultrahigh-resolution spectroscopy. The examples of successful use of the vertical dispersion modifications of the double-crystal and the Johann sepctrometer in diagnostics of several types of laser-generated plasma are presented.

Paper Details

Date Published: 18 September 1995
PDF: 10 pages
Proc. SPIE 2523, Applications of Laser Plasma Radiation II, (18 September 1995); doi: 10.1117/12.220976
Show Author Affiliations
Oldrich Renner, Institute of Physics (Czech Republic)
Thomas Missalla, Friedrich-Schiller-Univ. Jena (Germany)
Eckhart Foerster, Friedrich-Schiller-Univ. Jena (Germany)


Published in SPIE Proceedings Vol. 2523:
Applications of Laser Plasma Radiation II
Martin C. Richardson; George A. Kyrala, Editor(s)

© SPIE. Terms of Use
Back to Top