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Proceedings Paper

A data science approach to understanding photovoltaic module degradation
Author(s): Nicholas R. Wheeler; Abdulkerim Gok; Timothy J. Peshek; Laura S. Bruckman; Nikhil Goel; Davis Zabiyaka; Cara L. Fagerholm; Thomas Dang; Christopher Alcantara; Mason L. Terry; Roger H. French
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Paper Abstract

The expected lifetime performance and degradation of photovoltaic (PV) modules is a major issue facing the levelized cost of electricity of PV as a competitive energy source. Studies that quantify the rates and mechanisms of performance degradation are needed not only for bankability and adoption of these promising technologies, but also for the diagnosis and improvement of their mechanistic degradation pathways. Towards this goal, a generalizable approach to degradation science studies utilizing data science principles has been developed and applied to c-Si PV modules. By combining domain knowledge and data derived insights, mechanistic degradation pathways are indicated that link environmental stressors to the degradation of PV module performance characteristics. Targeted studies guided by these results have yielded predictive equations describing rates of degradation, and further studies are underway to achieve this for additional mechanistic pathways of interest.

Paper Details

Date Published: 23 September 2015
PDF: 6 pages
Proc. SPIE 9563, Reliability of Photovoltaic Cells, Modules, Components, and Systems VIII, 95630L (23 September 2015); doi: 10.1117/12.2209204
Show Author Affiliations
Nicholas R. Wheeler, Case Western Reserve Univ. (United States)
Abdulkerim Gok, Case Western Reserve Univ. (United States)
Timothy J. Peshek, Case Western Reserve Univ. (United States)
Laura S. Bruckman, Case Western Reserve Univ. (United States)
Nikhil Goel, Case Western Reserve Univ. (United States)
Davis Zabiyaka, Case Western Reserve Univ. (United States)
Cara L. Fagerholm, Case Western Reserve Univ. (United States)
Thomas Dang, Dupont Silicon Valley Technology Ctr. (United States)
Christopher Alcantara, Dupont Silicon Valley Technology Ctr. (United States)
Mason L. Terry, Dupont Silicon Valley Technology Ctr. (United States)
Roger H. French, Case Western Reserve Univ. (United States)


Published in SPIE Proceedings Vol. 9563:
Reliability of Photovoltaic Cells, Modules, Components, and Systems VIII
Neelkanth G. Dhere; John H. Wohlgemuth; Rebecca Jones-Albertus, Editor(s)

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