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Proceedings Paper

Echelle spectrometer for single shot elemental analysis
Author(s): Alexander Scheeline; Cheryl A. Bye; Duane L. Miller; Steven W. Rynders
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Paper Abstract

The paper presents a spectrometer combining echelles with imaging detectors and optimizing the echelle design to match the behavior of the detector, to be used for simultaneous high-resolution multiwavelength observations of a variety of discharges. The instrument utilizes a dual Czerny-Turner mount, with compensation of astigmatism generated in the first spectrometer by arranging the second spectrometer in a plane orthogonal to the first. Software for displaying spectra in false color, extraction of orders from echellograms, and wavelength calibration is outlined. Application of the spectrometer to the study of three plasma systems is described.

Paper Details

Date Published: 1 December 1990
PDF: 6 pages
Proc. SPIE 1318, Optical Spectroscopic Instrumentation and Techniques for the 1990s: Applications in Astronomy, Chemistry, and Physics, (1 December 1990); doi: 10.1117/12.22089
Show Author Affiliations
Alexander Scheeline, Univ. of Illinois/Urbana-Champaign (United States)
Cheryl A. Bye, Univ. of Illinois/Urbana-Champaign (United States)
Duane L. Miller, Univ. of Illinois/Urbana-Champaign (United States)
Steven W. Rynders, Univ. of Illinois/Urbana-Champaign (United States)


Published in SPIE Proceedings Vol. 1318:
Optical Spectroscopic Instrumentation and Techniques for the 1990s: Applications in Astronomy, Chemistry, and Physics
Bernard J. McNamara; Jeremy M. Lerner, Editor(s)

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