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Proceedings Paper

Development of on-line laser power monitoring system
Author(s): Chien-Fang Ding; Meng-Shiou Lee; Kuan-Ming Li
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Paper Abstract

Since the laser was invented, laser has been applied in many fields such as material processing, communication, measurement, biomedical engineering, defense industries and etc. Laser power is an important parameter in laser material processing, i.e. laser cutting, and laser drilling. However, the laser power is easily affected by the environment temperature, we tend to monitor the laser power status, ensuring there is an effective material processing. Besides, the response time of current laser power meters is too long, they cannot measure laser power accurately in a short time. To be more precisely, we can know the status of laser power and help us to achieve an effective material processing at the same time. To monitor the laser power, this study utilize a CMOS (Complementary metal-oxide-semiconductor) camera to develop an on-line laser power monitoring system. The CMOS camera captures images of incident laser beam after it is split and attenuated by beam splitter and neutral density filter. By comparing the average brightness of the beam spots and measurement results from laser power meter, laser power can be estimated. Under continuous measuring mode, the average measuring error is about 3%, and the response time is at least 3.6 second shorter than thermopile power meters; under trigger measuring mode which enables the CMOS camera to synchronize with intermittent laser output, the average measuring error is less than 3%, and the shortest response time is 20 millisecond.

Paper Details

Date Published: 9 March 2016
PDF: 6 pages
Proc. SPIE 9732, Real-time Measurements, Rogue Events, and Emerging Applications, 97320T (9 March 2016); doi: 10.1117/12.2208822
Show Author Affiliations
Chien-Fang Ding, National Taiwan Univ. (Taiwan)
Meng-Shiou Lee, National Taiwan Univ. (Taiwan)
Kuan-Ming Li, National Taiwan Univ. (Taiwan)

Published in SPIE Proceedings Vol. 9732:
Real-time Measurements, Rogue Events, and Emerging Applications
Bahram Jalali; Sergei K. Turitsyn; Daniel R. Solli; John M. Dudley, Editor(s)

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