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Proceedings Paper

Rapid stress-testing vs. long-term aging: a case study of 980-nm emitting single-spatial mode lasers
Author(s): Jens W. Tomm; Martin Hempel; David Venables; Victor Rossin; Erik Zucker; Thomas Elsaesser
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Paper Abstract

The degradation behaviors of 980-nm emitting nominally identical single-spatial mode lasers are studied during continuous wave long-term operation and during single-pulse stress tests. Both tests activate internal catastrophic optical damage as sudden degradation mechanism limiting the device lifetime. In case of high power stress-testing, the mechanism that initializes this effect is a spatial widening of the optical mode, resulting in increased absorption outside the waveguide. A similar disturbance to the optical mode is caused by defects that are generated during long-term operation. Thus two very different aging regimes eventually result in the same degradation scenario. We find that single-pulse stress-testing allows for activation of several degradation mechanisms in a device one after the other. Moreover, it becomes possible to distinguish between effects induced by gradual degradation and such that are independent on operation time. Thus stress-testing is considered a complementary tool, which might pave the way towards more economic device testing.

Paper Details

Date Published: 4 March 2016
PDF: 6 pages
Proc. SPIE 9733, High-Power Diode Laser Technology and Applications XIV, 973303 (4 March 2016); doi: 10.1117/12.2208256
Show Author Affiliations
Jens W. Tomm, Max-Born-Institut für Nichtlineare Optik und Kurzzeitspektroskopie (Germany)
Martin Hempel, Max-Born-Institut für Nichtlineare Optik und Kurzzeitspektroskopie (Germany)
Paul Drude Institut (Germany)
David Venables, Lumentum (United States)
Victor Rossin, Lumentum (United States)
Erik Zucker, Lumentum (United States)
Thomas Elsaesser, Max-Born-Institut für Nichtlineare Optik und Kurzzeitspektroskopie (Germany)


Published in SPIE Proceedings Vol. 9733:
High-Power Diode Laser Technology and Applications XIV
Mark S. Zediker, Editor(s)

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