Share Email Print
cover

Proceedings Paper

Photo-induced force for spectroscopic imaging at the nanoscale
Author(s): Junghoon Jahng; Faezeh Tork Ladani; Ryan Muhammad Khan; Eric Olaf Potma
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

Photo-induced force microscopy (PiFM) is a new scan probe method that enables imaging with spectroscopic contrast at the nanoscale. The operating principle of PiFM is based on the coupling between a sharp atomic tip and a polarizable object, as mediated by the electromagnetic field in the vicinity of the tip-sample junction. In this contribution, we develop a description of the photo-induced force in the limit where the tip and object can be approximated as dipoles. This description provides an insightful picture of the forces at play in the tip-sample junction in terms of the gradient and scattering forces. We consider various approximations that are relevant to experimental conditions. The theoretical approach described here successfully explains the previous spectroscopic PiFM measurements in the visible and in the near-IR range, and the anticipated spectral information that can be retrieved under mid infrared illumination.

Paper Details

Date Published: 4 March 2016
PDF: 8 pages
Proc. SPIE 9764, Complex Light and Optical Forces X, 97641J (4 March 2016); doi: 10.1117/12.2208199
Show Author Affiliations
Junghoon Jahng, Univ. of California, Irvine (United States)
Faezeh Tork Ladani, Univ. of California, Irvine (United States)
Ryan Muhammad Khan, Univ. of California, Irvine (United States)
Eric Olaf Potma, Univ. of California, Irvine (United States)


Published in SPIE Proceedings Vol. 9764:
Complex Light and Optical Forces X
Jesper Glückstad; David L. Andrews; Enrique J. Galvez, Editor(s)

© SPIE. Terms of Use
Back to Top