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Proceedings Paper

Leaky waveguides for low k-measurement: From structure design to loss evaluation
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Paper Abstract

For high quality optical coatings the knowledge of the losses of the deposited materials is essential. A precise measurement of low Im(n+iκ)≤ 10-6 at an intended operation wavelength and with low intensity can be achieved in waveguide configurations, whereby leaky waveguide configurations allow one to analyze losses of high- and low-index media of H-L-stacks as well due to resonances in the angle-dependent reflection curve. Numerical investigations reveal that different leaky wave schemes, e.g. Bragg-, Bloch- and Antiresonant-Reflecting waveguides, comply differently with practical requests. Loss figure evaluation requires peculiar attention due to measurement accuracy and ambiguities, thus suitable constraints for layer data and a proper merit-function construction have to be used.

Paper Details

Date Published: 1 March 2016
PDF: 10 pages
Proc. SPIE 9750, Integrated Optics: Devices, Materials, and Technologies XX, 975019 (1 March 2016); doi: 10.1117/12.2208133
Show Author Affiliations
Christoph Wächter, Fraunhofer-Institut für Angewandte Optik und Feinmechanik (Germany)
Riccardo Rizzo, Fraunhofer-Institut für Angewandte Optik und Feinmechanik (Germany)
Francesco Michelotti, Sapienza Univ. di Roma (Italy)
Peter Munzert, Fraunhofer-Institut für Angewandte Optik und Feinmechanik (Germany)
Norbert Danz, Fraunhofer-Institut für Angewandte Optik und Feinmechanik (Germany)


Published in SPIE Proceedings Vol. 9750:
Integrated Optics: Devices, Materials, and Technologies XX
Jean-Emmanuel Broquin; Gualtiero Nunzi Conti, Editor(s)

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