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Proceedings Paper • Open Access

New microscopy based on liquid crystals and its application to students’ education and researches
Author(s): M. G. Tomilin

Paper Abstract

The optical microscope operation is limited with illumination distribution detecting on the object surface in reflective regime and absorption object parameters detecting in transparent regime. The functions are increased by observation the objects in polarizing light. The inside tension and optical activity in transparent materials becomes visible. Optical polarizing microscopy is powerful tool for investigations in many fields of science and technology. But it is helpless in detecting invisible physical fields’ distribution on the object surface. The combination of optical polarizing microscope with liquid crystal spatial light modulator in contact with objects’ increases its functions. The novelty of microscope consists in LC layer introduction in optical scheme to observe its local deformations in real time. LC applied as recording media has to be in contact with the surface under investigation. In this case LC detects the invisible physical fields on the object’s surface: intermolecular interactions, electrical, magnetic fields, etc. The results were obtained with high optical resolution and sensitivity. The operation with new microscope is very simple. The unique information was received in examination the surfaces of solid crystals, minerals, metals, semiconductors, polymers, glasses, optical coatings. The most valuable information was obtained in biophotonics. The simplicity of new microscopic methods made possible to recruit for serious scientific investigations the students from first to fifth year of education. Students’ participation helps to get rich statistic results and to check their reproducibility. The students also got experience in oral presentations of the results.

Paper Details

Date Published: 5 June 2009
PDF: 11 pages
Proc. SPIE 9666, 11th Education and Training in Optics and Photonics Conference, 96661Q (5 June 2009); doi: 10.1117/12.2208083
Show Author Affiliations
M. G. Tomilin, St. Petersburg Univ. of Information Technologies (Russian Federation)


Published in SPIE Proceedings Vol. 9666:
11th Education and Training in Optics and Photonics Conference
K. Alan Shore, Editor(s)

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