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Proceedings Paper • Open Access

Development of diode laser pointer-based Michelson interferometer for the measurement of optical parameters
Author(s): A. K. Chaudhary

Paper Abstract

The paper reports the development of an inexpensive laser diode pointer of wavelength λ=630-680 nm based Michelson interferometer technique for the measurement of optical parameters such as wavelength of the source, thickness of a thin sheets of glass, mica etc. in the Optics Laboratory of the Department of Physics Addis Ababa University, Addis Ababa, Ethiopia. The He-Ne laser source (λ=632.8 nm) in the Michelson interferometer experiment is replaced by small size battery operated LDP of small beam of diameter = 3mm with simple modification in the optics system to measure the aforesaid optical parameters.

Paper Details

Date Published: 24 October 2005
PDF: 2 pages
Proc. SPIE 9664, Ninth International Topical Meeting on Education and Training in Optics and Photonics, 966423 (24 October 2005); doi: 10.1117/12.2207571
Show Author Affiliations
A. K. Chaudhary, Consultant (India)


Published in SPIE Proceedings Vol. 9664:
Ninth International Topical Meeting on Education and Training in Optics and Photonics
François Flory, Editor(s)

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