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Proceedings Paper

Polarization properties of nonsymmetric retroreflectors
Author(s): Chang-Hyuk An; John W. Morris
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Paper Abstract

The on- and off-axis polarizing properties of asymmetric retroreflectors are studied in detail for various angles of incidence and for various incident linear polarization states. An analytic model is developed by applying Fresnel law to the incident and reflecting radiation on each facet of the retroreflector. It is shown that the polarization state of retroreflected radiation is a sensitive function of incident angle, incident polarization rate, and retroreflector material. These characteristics may be applicable to the determination of the relative angular position between the retroreflector and the analyzer.

Paper Details

Date Published: 1 October 1990
PDF: 13 pages
Proc. SPIE 1317, Polarimetry: Radar, Infrared, Visible, Ultraviolet, and X-Ray, (1 October 1990); doi: 10.1117/12.22069
Show Author Affiliations
Chang-Hyuk An, Applied Research, Inc. (United States)
John W. Morris, Applied Research, Inc. (United States)

Published in SPIE Proceedings Vol. 1317:
Polarimetry: Radar, Infrared, Visible, Ultraviolet, and X-Ray
Russell A. Chipman; John W. Morris, Editor(s)

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