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Proceedings Paper

The CMS fast beams condition monitor back-end electronics based on MicroTCA technology: status and development
Author(s): Agnieszka A. Zagozdzinska; Anne E. Dabrowski; Krzysztof T. Pozniak
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Paper Abstract

The Fast Beams Condition Monitor (BCM1F), upgraded for LHC Run II, is used to measure the online luminosity and machine induced background for the CMS experiment. The detector consists of 24 single-crystal CVD diamond sensors that are read out with a custom fast front-end chip fabricated in 130 nm CMOS technology. Since the signals from the sensors are used for real time monitoring of the LHC conditions they are processed by dedicated back-end electronics to measure separately rates corresponding to LHC collision products, machine induced background and residual activation exploiting different arrival times. The system is built in MicroTCA technology and uses high speed analog-to-digital converters. In operational modes of high rates, consecutive events, spaced in time by less than 12.5 ns, may cause partially overlapping events. Hence, novel signal processing techniques are deployed to resolve overlapping peaks. The high accuracy qualification of the signals is crucial to determine the luminosity and the machine induced background rates for the CMS experiment and the LHC.

Paper Details

Date Published: 11 September 2015
PDF: 7 pages
Proc. SPIE 9662, Photonics Applications in Astronomy, Communications, Industry, and High-Energy Physics Experiments 2015, 966235 (11 September 2015); doi: 10.1117/12.2205877
Show Author Affiliations
Agnieszka A. Zagozdzinska, Warsaw Univ. of Technology (Poland)
CERN (Switzerland)
Anne E. Dabrowski, CERN (Switzerland)
Krzysztof T. Pozniak, Warsaw Univ. of Technology (Poland)


Published in SPIE Proceedings Vol. 9662:
Photonics Applications in Astronomy, Communications, Industry, and High-Energy Physics Experiments 2015
Ryszard S. Romaniuk, Editor(s)

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