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Proceedings Paper

Research on the illumination model based on light scattering properties of steel surface
Author(s): Yuanjiong Liu; Jianyi Kong; Pan Xu; Cancan Liu; Guo Zheng
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Paper Abstract

Experimental scheme was designed based on the steel production process, surface optical characteristics and BRDF (Bidirectional Reflectance Distribution Function) illumination model theory. The relationship between the light incidence angle, surface roughness and laws of light scattering under a particular light-source conditions were found through a series of light scattering characteristics experiments for different steel plate surface. The results showed that there was an apparent specular reflection peak on steel surface. surface light scattering was influenced greatly by light incidence angle and surface roughness, and it showed the law of exponential distribution functions. Thus the improved semi-empirical light scattering mathematical model which based on roughness factor and surface Gaussian distribution of micro-plane components has been formed through non-linear model fitting and optimization. The surface illumination model has been proposed to accurately describe the light intensity distribution of steel plate surface and provide a theoretical method for the design of optimal imaging system.

Paper Details

Date Published: 14 December 2015
PDF: 7 pages
Proc. SPIE 9815, MIPPR 2015: Remote Sensing Image Processing, Geographic Information Systems, and Other Applications, 98151Q (14 December 2015); doi: 10.1117/12.2205637
Show Author Affiliations
Yuanjiong Liu, Wuhan Univ. of Science and Technology (China)
Jianyi Kong, Wuhan Univ. of Science and Technology (China)
Pan Xu, Wuhan Univ. of Science and Technology (China)
Wuhan Iron and Steel Co., Ltd. (China)
Cancan Liu, Wuhan Univ. of Science and Technology (China)
Guo Zheng, Wuhan Univ. of Science and Technology (China)


Published in SPIE Proceedings Vol. 9815:
MIPPR 2015: Remote Sensing Image Processing, Geographic Information Systems, and Other Applications
Jianguo Liu; Hong Sun, Editor(s)

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