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Proceedings Paper

Raman studies of C-Ni/Ti films deposited on Si (100)
Author(s): R. Belka; J. Keczkowska; M. Suchańska; P. Firek; H. Wronka; J. Radomska; E. Czerwosz
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Paper Abstract

The thin films of carbon-nickel (C-Ni) nanocoposites were deposited on Ti-evaporated Si (100) substrate using Physical Vapour Deposition (PVD) method. Influence of evaporated titanium on carbonaceous structure of C-Ni films were investigated by Raman spectroscopy method. The fullerite-graphite structure was recognize using principal component analysis (PCA) of obtained Raman spectra.

Paper Details

Date Published: 11 September 2015
PDF: 7 pages
Proc. SPIE 9662, Photonics Applications in Astronomy, Communications, Industry, and High-Energy Physics Experiments 2015, 966249 (11 September 2015); doi: 10.1117/12.2205546
Show Author Affiliations
R. Belka, Kielce Univ. of Technology (Poland)
J. Keczkowska, Kielce Univ. of Technology (Poland)
M. Suchańska, Kielce Univ. of Technology (Poland)
P. Firek, Warsaw Univ. of Technology (Poland)
H. Wronka, Tele & Radio Research Institute (Poland)
J. Radomska, Tele & Radio Research Institute (Poland)
E. Czerwosz, Tele & Radio Research Institute (Poland)


Published in SPIE Proceedings Vol. 9662:
Photonics Applications in Astronomy, Communications, Industry, and High-Energy Physics Experiments 2015
Ryszard S. Romaniuk, Editor(s)

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