Share Email Print

Proceedings Paper

A computation method of dual-material separation based on dual-energy CT imaging
Author(s): Jing Zou; Ming Chen; Jintao Zhao; Hanyu Lv; Xiaodong Hu
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

Dual-energy x-ray technique, which consists in combining two radiographs acquired at two kilovoltage, can improve the identity of the compositions of object over regular CT, or at least improve image contrast. Dual-energy equations can be easily written and solved for ideally monochromatic x-ray source and perfect detector, but become complex when considering polychromatic x-ray source, detector sensitivity, and system non–linearity. In this paper, a new dual-energy algorithm which employed the basis material decomposition method was investigated for improving material separation capability. Studies by using computer-simulated data were performed to validate and evaluate the algorithm. The preliminary results of the study show that, with the proposed algorithm, separated “material specific” images of dual-material object could be obtained. Also monochromatic image can be acquired at arbitrary desired energy which could enhance image contrast in comparison with conventional reconstructed image.

Paper Details

Date Published: 15 October 2015
PDF: 6 pages
Proc. SPIE 9672, AOPC 2015: Advanced Display Technology; and Micro/Nano Optical Imaging Technologies and Applications, 967216 (15 October 2015); doi: 10.1117/12.2204870
Show Author Affiliations
Jing Zou, Tianjin Univ. (China)
Ming Chen, Shandong Univ. of Science and Technology (China)
Jintao Zhao, Tianjin Univ. (China)
Hanyu Lv, Tianjin Univ. (China)
Xiaodong Hu, Tianjin Univ. (China)

Published in SPIE Proceedings Vol. 9672:
AOPC 2015: Advanced Display Technology; and Micro/Nano Optical Imaging Technologies and Applications
Byoungho Lee; Yikai Su; Min Gu; Xiaocong Yuan; Daniel Jaque, Editor(s)

© SPIE. Terms of Use
Back to Top