Share Email Print

Proceedings Paper

Accurate mask model implementation in OPC model for 14nm nodes and beyond
Author(s): Nacer Zine El Abidine; Frank Sundermann; Emek Yesilada; Vincent Farys; Frederic Huguennet; Ana-Maria Armeanu; Ingo Bork; Michael Chomat; Peter Buck; Isabelle Schanen
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

In a previous work [1] we demonstrated that current OPC model assuming the mask pattern to be analogous to the designed data is no longer valid. Indeed as depicted in figure 1, an extreme case of line-end shortening shows a gap up to 10 nm difference (at mask level). For that reason an accurate mask model, for a 14nm logic gate level has been calibrated. A model with a total RMS of 1.38nm at mask level was obtained. 2D structures such as line-end shortening and corner rounding were well predicted using SEM pictures overlaid with simulated contours. The first part of this paper is dedicated to the implementation of our improved model in current flow. The improved model consists of a mask model capturing mask process and writing effects and a standard optical and resist model addressing the litho exposure and development effects at wafer level. The second part will focus on results from the comparison of the two models, the new and the regular, as depicted in figure 2.

Paper Details

Date Published: 23 October 2015
PDF: 13 pages
Proc. SPIE 9635, Photomask Technology 2015, 96350W (23 October 2015); doi: 10.1117/12.2203267
Show Author Affiliations
Nacer Zine El Abidine, STMicroelectronics (France)
IMEP-LAHC (France)
Frank Sundermann, STMicroelectronics (France)
Emek Yesilada, STMicroelectronics (France)
Vincent Farys, STMicroelectronics (France)
Frederic Huguennet, Mentor Graphics Corp. (France)
Ana-Maria Armeanu, Mentor Graphics Corp. (France)
Ingo Bork, Mentor Graphics Corp. (United States)
Michael Chomat, Mentor Graphics Corp. (France)
Peter Buck, Mentor Graphics Corp. (United States)
Isabelle Schanen, IMEP-LAHC (France)

Published in SPIE Proceedings Vol. 9635:
Photomask Technology 2015
Naoya Hayashi, Editor(s)

© SPIE. Terms of Use
Back to Top