Share Email Print
cover

Proceedings Paper

Study on high resolution and high repeatability target localization algorithm in development of national level standard
Author(s): Yao Huang; Weichen Wang; Zi Xue
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

At the National Institute of Metrology, China, the national level standard was established for calibrating the level measuring instruments widely used in the field of surveying, construction and engineering. As a key technology in the development, an auto collimation system was set up to compare the level under test with the water level. In the auto collimation system, a charge-coupled device (CCD) camera was set up to acquired the image of a light spot reflected from the water surface and the plane mirror, a composite image processing and analyzing algorithm was designed to find the exact position of the light spot in the image. This target localization algorithm consists of sub-algorithm of background de-noising, dimension transforming, and curve fitting. The experiments prove that this algorithm get resolution of 0.002″, and repeatability of 0.01″.

Paper Details

Date Published: 8 October 2015
PDF: 6 pages
Proc. SPIE 9675, AOPC 2015: Image Processing and Analysis, 967534 (8 October 2015); doi: 10.1117/12.2203028
Show Author Affiliations
Yao Huang, National Institute of Metrology (China)
Weichen Wang, National Institute of Metrology (China)
Zi Xue, National Institute of Metrology (China)


Published in SPIE Proceedings Vol. 9675:
AOPC 2015: Image Processing and Analysis
Chunhua Shen; Weiping Yang; Honghai Liu, Editor(s)

© SPIE. Terms of Use
Back to Top