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Proceedings Paper

The correction of vibration in frequency scanning interferometry based absolute distance measurement system for dynamic measurements
Author(s): Cheng Lu; Guodong Liu; Bingguo Liu; Fengdong Chen; Zhitao Zhuang; Xinke Xu; Yu Gan
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Paper Abstract

Absolute distance measurement systems are of significant interest in the field of metrology, which could improve the manufacturing efficiency and accuracy of large assemblies in fields such as aircraft construction, automotive engineering, and the production of modern windmill blades. Frequency scanning interferometry demonstrates noticeable advantages as an absolute distance measurement system which has a high precision and doesn’t depend on a cooperative target. In this paper , the influence of inevitable vibration in the frequency scanning interferometry based absolute distance measurement system is analyzed. The distance spectrum is broadened as the existence of Doppler effect caused by vibration, which will bring in a measurement error more than 103 times bigger than the changes of optical path difference. In order to decrease the influence of vibration, the changes of the optical path difference are monitored by a frequency stabilized laser, which runs parallel to the frequency scanning interferometry. The experiment has verified the effectiveness of this method.

Paper Details

Date Published: 8 October 2015
PDF: 8 pages
Proc. SPIE 9677, AOPC 2015: Optical Test, Measurement, and Equipment, 96772F (8 October 2015); doi: 10.1117/12.2202811
Show Author Affiliations
Cheng Lu, Harbin Institute of Technology (China)
Guodong Liu, Harbin Institute of Technology (China)
Bingguo Liu, Harbin Institute of Technology (China)
Fengdong Chen, Harbin Institute of Technology (China)
Zhitao Zhuang, Harbin Institute of Technology (China)
Xinke Xu, Harbin Institute of Technology (China)
Yu Gan, Harbin Institute of Technology (China)

Published in SPIE Proceedings Vol. 9677:
AOPC 2015: Optical Test, Measurement, and Equipment
Sen Han; Jonathan D. Ellis; Junpeng Guo; Yongcai Guo, Editor(s)

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