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Proceedings Paper

Study on feasibility of laser reflective tomography with satellite-accompany
Author(s): Yu Gu; Yi-hua Hu; Shi-qi Hao; You-lin Gu; Nan-xiang Zhao; Yang-yang Wang
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Paper Abstract

Laser reflective tomography is a long-range, high-resolution active detection technology, whose advantage is that the spatial resolution is unrelated with the imaging distance. Accompany satellite is a specific satellite around the target spacecraft with encircling movement. When using the accompany satellite to detect the target aircraft, multi-angle echo data can be obtained with the application of reflective tomography imaging. The feasibility of such detection working mode was studied in this article. Accompany orbit model was established with horizontal circular fleet and the parameters of accompany flight was defined. The simulation of satellite-to-satellite reflective tomography imaging with satellite-accompany was carried out. The operating mode of reflective tomographic data acquisition from monostatic laser radar was discussed and designed. The flight period, which equals to the all direction received data consuming time, is one of the important accompany flight parameters. The azimuth angle determines the plane of image formation while the elevation angle determines the projection direction. Both of the azimuth and elevation angles guide the satellite attitude stability controller in order to point the laser radar spot on the target. The influences of distance between accompany satellite and target satellite on tomographic imaging consuming time was analyzed. The influences of flight period, azimuth angle and elevation angle on tomographic imaging were analyzed as well. Simulation results showed that the satellite-accompany laser reflective tomography is a feasible and effective method to the satellite-to-satellite detection.

Paper Details

Date Published: 15 October 2015
PDF: 6 pages
Proc. SPIE 9674, AOPC 2015: Optical and Optoelectronic Sensing and Imaging Technology, 96742T (15 October 2015); doi: 10.1117/12.2202763
Show Author Affiliations
Yu Gu, Electronic Engineering Institute (China)
Anhui Province Key Lab. of Electronic Restriction Technology (China)
Yi-hua Hu, Electronic Engineering Institute (China)
Anhui Province Key Lab. of Electronic Restriction Technology (China)
Shi-qi Hao, Electronic Engineering Institute (China)
Anhui Province Key Lab. of Electronic Restriction Technology (China)
You-lin Gu, Electronic Engineering Institute (China)
Anhui Province Key Lab. of Electronic Restriction Technology (China)
Nan-xiang Zhao, Electronic Engineering Institute (China)
Anhui Province Key Lab. of Electronic Restriction Technology (China)
Yang-yang Wang, Electronic Engineering Institute (China)
Anhui Province Key Lab. of Electronic Restriction Technology (China)


Published in SPIE Proceedings Vol. 9674:
AOPC 2015: Optical and Optoelectronic Sensing and Imaging Technology
Haimei Gong; Nanjian Wu; Yang Ni; Weibiao Chen; Jin Lu, Editor(s)

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