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Proceedings Paper

Al-Li alloy AA2198's very high cycle fatigue crack initiation mechanism and its fatigue thermal effect
Author(s): Luopeng Xu; Xiaojian Cao; Yu Chen; Qingyuan Wang
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Paper Abstract

AA2198 alloy is one of the third generation Al-Li alloys which have low density, high elastic modulus, high specific strength and specific stiffness. Compared With the previous two generation Al-Li alloys, the third generation alloys have much improved in alloys strength, corrosion resistance and weldable characteristic. For these advantages, the third generation Al-Li alloys are used as aircraft structures, such as C919 aviation airplane manufactured by China and Russia next generation aviation airplane--MS-21. As we know, the aircraft structures are usually subjected to more than 108 cycles fatigue life during 20-30 years of service, however, there is few reported paper about the third generation Al-Li alloys’ very high cycle fatigue(VHCF) which is more than 108 cycles fatigue. The VHCF experiment of AA2198 have been carried out. The two different initiation mechanisms of fatigue fracture have been found in VHCF. The cracks can initiate from the interior of the testing material with lower stress amplitude and more than 108 cycles fatigue life, or from the surface or subsurface of material which is the dominant reason of fatigue failures. During the experiment, the infrared technology is used to monitor the VHCF thermal effect. With the increase of the stress, the temperature of sample is also rising up, increasing about 15 °C for every 10Mpa. The theoretical thermal analysis is also carried out.

Paper Details

Date Published: 8 October 2015
PDF: 6 pages
Proc. SPIE 9677, AOPC 2015: Optical Test, Measurement, and Equipment, 967724 (8 October 2015); doi: 10.1117/12.2202283
Show Author Affiliations
Luopeng Xu, Civil Aviation Flight Univ. of China (China)
Sichuan Univ. (China)
Xiaojian Cao, Nantong Univ. (China)
Yu Chen, Sichuan Univ. (China)
Qingyuan Wang, Sichuan Univ. (China)

Published in SPIE Proceedings Vol. 9677:
AOPC 2015: Optical Test, Measurement, and Equipment
Sen Han; Jonathan D. Ellis; Junpeng Guo; Yongcai Guo, Editor(s)

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