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Proceedings Paper

Plasmonic response in nanoporous metal: dependence on network topology
Author(s): Marc A. Galí; Matthew C. Tai; Matthew D. Arnold; Michael B. Cortie; Angus R. Gentle; Geoffrey B. Smith
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Paper Abstract

The optical and electrical responses of open, nanoscale, metal networks are of interest in a variety of technologies including transparent conducting electrodes, charge storage, and surfaces with controlled spectral selectivity. The properties of such nanoporous structures depend on the shape and extent of individual voids and the associated hyper-dimensional connectivity and density of the metal filaments. Unfortunately, a quantitative understanding of this dependence is at present only poorly developed. Here we address this problem using numerical simulations applied to a systematically designed series of prototypical sponges. The sponges are produced by a Monte Carlo simulation of the dealloying of Ag-Al alloys containing from 60% to 85% Al. The result is a series of Ag sponges of realistic morphology. The optical properties of the sponges are then calculated by the discrete dipole approximation and the results used to construct an 'effective medium' model for each sponge. We show how the resulting effective medium can be correlated with the associated morphological characteristics of each target and how the optical properties are primarily controlled by the density of the sponge and its state of percolation.

Paper Details

Date Published: 22 December 2015
PDF: 10 pages
Proc. SPIE 9668, Micro+Nano Materials, Devices, and Systems, 96683S (22 December 2015); doi: 10.1117/12.2202278
Show Author Affiliations
Marc A. Galí, Univ. of Technology, Sydney (Australia)
Matthew C. Tai, Univ. of Technology, Sydney (Australia)
Matthew D. Arnold, Univ. of Technology, Sydney (Australia)
Michael B. Cortie, Univ. of Technology, Sydney (Australia)
Angus R. Gentle, Univ. of Technology, Sydney (Australia)
Geoffrey B. Smith, Univ. of Technology, Sydney (Australia)

Published in SPIE Proceedings Vol. 9668:
Micro+Nano Materials, Devices, and Systems
Benjamin J. Eggleton; Stefano Palomba, Editor(s)

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