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Proceedings Paper

Study on the measurement system of the target polarization characteristics and test
Author(s): Qiang Fu; Yong Zhu; Su Zhang; Jin Duan; Di Yang; Juntong Zhan; Xiaoman Wang; Hui-Lin Jiang
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Paper Abstract

The polarization imaging detection technology increased the polarization information on the basis of the intensity imaging, which is extensive application in the military and civil and other fields, the research on the polarization characteristics of target is particularly important. The research of the polarization reflection model was introduced in this paper, which describes the scattering vector light energy distribution in reflecting hemisphere polarization characteristics, the target polarization characteristics test system solutions was put forward, by the irradiation light source, measuring turntable and camera, etc, which illuminate light source shall direct light source, with laser light sources and xenon lamp light source, light source can be replaced according to the test need; Hemispherical structure is used in measuring circumarotate placed near its base material sample, equipped with azimuth and pitching rotation mechanism, the manual in order to adjust the azimuth Angle and high Angle observation; Measuring camera pump works, through the different in the way of motor control polaroid polarization test, to ensure the accuracy of measurement and imaging resolution. The test platform has set up by existing laboratory equipment, the laser is 532 nm, line polaroid camera, at the same time also set the sending and receiving optical system. According to the different materials such as wood, metal, plastic, azimuth Angle and zenith Angle in different observation conditions, measurement of target in the polarization scattering properties of different exposure conditions, implementation of hemisphere space pBRDF measurement.

Paper Details

Date Published: 8 October 2015
PDF: 6 pages
Proc. SPIE 9677, AOPC 2015: Optical Test, Measurement, and Equipment, 96771X (8 October 2015); doi: 10.1117/12.2199898
Show Author Affiliations
Qiang Fu, Changchun Univ. of Science and Technology (China)
Yong Zhu, Changchun Univ. of Science and Technology (China)
Su Zhang, Changchun Univ. of Science and Technology (China)
Jin Duan, Changchun Univ. of Science and Technology (China)
Di Yang, Changchun Univ. of Science and Technology (China)
Juntong Zhan, Changchun Univ. of Science and Technology (China)
Xiaoman Wang, Changchun Univ. of Science and Technology (China)
Hui-Lin Jiang, Changchun Univ. of Science and Technology (China)


Published in SPIE Proceedings Vol. 9677:
AOPC 2015: Optical Test, Measurement, and Equipment
Sen Han; Jonathan D. Ellis; Junpeng Guo; Yongcai Guo, Editor(s)

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