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Proceedings Paper

Research on the system scheme and experiment for the active laser polarization imaging
Author(s): Qiang Fu; Jin Duan; Rui Zhao; Zheng Li; Su Zhang; Juntong Zhan; Yong Zhu; Hui-Lin Jiang
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Paper Abstract

The polarization imaging detection technology increased the polarization information on the basis of the intensity imaging, which is extensive application in the military and civil and other fields. The research present and development trend of polarization imaging detection technology was introduce, the system scheme of the active polarization imaging detection was put forward, and the key technologies such as the polarization information detection, optical system design, polarization radiation calibration and image fusion approach was analyzed. On this basis, detection system by existing equipment of laboratory was set up, and on the different materials such as wood, metal, plastic and goal was detected by polarization imaging to realize the active polarization imaging detection. The results show that image contrast of the metal and man-made objects is higher, the polarization effect is better, which provided the basis on the better performance of the polarization imaging instruments.

Paper Details

Date Published: 15 October 2015
PDF: 7 pages
Proc. SPIE 9674, AOPC 2015: Optical and Optoelectronic Sensing and Imaging Technology, 967426 (15 October 2015); doi: 10.1117/12.2199897
Show Author Affiliations
Qiang Fu, Changchun Univ. of Science and Technology (China)
Jin Duan, Changchun Univ. of Science and Technology (China)
Rui Zhao, Changchun Univ. of Science and Technology (China)
Zheng Li, Changchun Univ. of Science and Technology (China)
Su Zhang, Changchun Univ. of Science and Technology (China)
Juntong Zhan, Changchun Univ. of Science and Technology (China)
Yong Zhu, Changchun Univ. of Science and Technology (China)
Hui-Lin Jiang, Changchun Univ. of Science and Technology (China)


Published in SPIE Proceedings Vol. 9674:
AOPC 2015: Optical and Optoelectronic Sensing and Imaging Technology
Haimei Gong; Nanjian Wu; Yang Ni; Weibiao Chen; Jin Lu, Editor(s)

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