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Proceedings Paper

Method on camouflaged target recognition using the angle of ellipsometry
Author(s): Xiao-bo Zhuansun; Wen-Yuan Wu; Yan-hua Huang; Zhao-zhao Li
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Paper Abstract

Using polarimetric information of the camouflaged target surface to identify camouflage has been a hot research area in camouflage detecting. The main method is to use the difference in the degree of polarization(DOP) between background and target to add the contrast ratio of them. The measurement of the DOP has some requirements on the intensity of reflected radiation. In case of low reflected radiation intensity, the difference in the DOP for different materials is not so distinguishable. In addition, the linear degree of polarization is largely under the effects of detection angle and surface roughness, so it is hard to differentiate the degree of polarization when the targets with similar surface roughness are detected at the same detection angle. By analyzing the elements affecting the reflected electromagnetic radiation amplitudes and phase on the camouflaged target surface, this article makes a research on the polarization character of reflected radiation A method on camouflaged target recognition directly or indirectly by taking the angle of ellipsometry (AOE) imaging under the linear polarized light. The function model of the angle of incidence, complex refractive index and AOE was modeled, then the model was simulated by MATLAB and the results showed it can describe the distribution properties of AOE. A new thought for the approach of identifying camouflaged target recognition by detecting polarimetric information was proposed, and it has a deep theoretical and practical significance in camouflaged target recognition.

Paper Details

Date Published: 8 October 2015
PDF: 6 pages
Proc. SPIE 9675, AOPC 2015: Image Processing and Analysis, 967521 (8 October 2015); doi: 10.1117/12.2199796
Show Author Affiliations
Xiao-bo Zhuansun, PLA Univ. of Science and Technology (China)
Wen-Yuan Wu, PLA Univ. of Science and Technology (China)
Yan-hua Huang, PLA Univ. of Science and Technology (China)
Zhao-zhao Li, PLA Univ. of Science and Technology (China)


Published in SPIE Proceedings Vol. 9675:
AOPC 2015: Image Processing and Analysis
Chunhua Shen; Weiping Yang; Honghai Liu, Editor(s)

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