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Proceedings Paper

Improved photon counting efficiency calibration using superconducting single photon detectors
Author(s): Haiyong Gan; Nan Xu; Jianwei Li; Ruoduan Sun; Guojin Feng; Yanfei Wang; Chong Ma; Yandong Lin; Labao Zhang; Lin Kang; Jian Chen; Peiheng Wu
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Paper Abstract

The quantum efficiency of photon counters can be measured with standard uncertainty below 1% level using correlated photon pairs generated through spontaneous parametric down-conversion process. Normally a laser in UV, blue or green wavelength range with sufficient photon energy is applied to produce energy and momentum conserved photon pairs in two channels with desired wavelengths for calibration. One channel is used as the heralding trigger, and the other is used for the calibration of the detector under test. A superconducting nanowire single photon detector with advantages such as high photon counting speed (<20 MHz), low dark count rate (<50 counts per second), and wideband responsivity (UV to near infrared) is used as the trigger detector, enabling correlated photons calibration capabilities into shortwave visible range. For a 355nm single longitudinal mode pump laser, when a superconducting nanowire single photon detector is used as the trigger detector at 1064nm and 1560nm in the near infrared range, the photon counting efficiency calibration capabilities can be realized at 532nm and 460nm. The quantum efficiency measurement on photon counters such as photomultiplier tubes and avalanche photodiodes can be then further extended in a wide wavelength range (e.g. 400-1000nm) using a flat spectral photon flux source to meet the calibration demands in cutting edge low light applications such as time resolved fluorescence and nonlinear optical spectroscopy, super resolution microscopy, deep space observation, and so on.

Paper Details

Date Published: 15 October 2015
PDF: 9 pages
Proc. SPIE 9674, AOPC 2015: Optical and Optoelectronic Sensing and Imaging Technology, 96741W (15 October 2015); doi: 10.1117/12.2199705
Show Author Affiliations
Haiyong Gan, National Institute of Metrology (China)
Nan Xu, National Institute of Metrology (China)
Jianwei Li, National Institute of Metrology (China)
Ruoduan Sun, National Institute of Metrology (China)
Guojin Feng, National Institute of Metrology (China)
Yanfei Wang, National Institute of Metrology (China)
Chong Ma, National Institute of Metrology (China)
Yandong Lin, National Institute of Metrology (China)
Labao Zhang, Nanjing Univ. (China)
Lin Kang, Nanjing Univ. (China)
Jian Chen, Nanjing Univ. (China)
Peiheng Wu, Nanjing Univ. (China)


Published in SPIE Proceedings Vol. 9674:
AOPC 2015: Optical and Optoelectronic Sensing and Imaging Technology
Haimei Gong; Nanjian Wu; Yang Ni; Weibiao Chen; Jin Lu, Editor(s)

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