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Proceedings Paper

Beat frequency nonlinearity compensation based on fiber reference channel in laser frequency scanning interferometer
Author(s): Xinke Xu; Guodong Liu; Bingguo Liu; Fengdong Chen; Zhitao Zhuang; Yu Gan; Cheng Lu
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Paper Abstract

High resolution and simple device ranging technology has prospects of broad application and attractive. Laser frequency scanning interferometer has capability of high-resolution, low-noise ratio measurement. The tuning nonlinearity is a main factor limited to the ranging resolution which needs to be corrected. When using hardware to correct laser tuning nonlinearity, it would increases the complexity of the instrument structure. For the purpose of making structure of the instrument much simple, we proposed a method that using fiber reference channel to compensate the nonlinearity of measurement path beat frequency, which can achieve high resolution measurement. The method require obtaining the reference and measurement path beat signal simultaneously, then extracting the phase of the reference channel signal which is formed by fiber end face to compensate the nonlinearity of measurement signal. Hilbert transform is used to calculate the phase of signal, and empirical mode decomposition (EMD) method is used to reduce the noise of reference signal. The laser frequency scanning interferometer is demonstrated by experiment, we show that this performance enables 132μm for 10nm tuning bandwidth over several meter range. The method does not need to estimate the tuning nonlinearity function, so it could reduce the complexity of algorithm.

Paper Details

Date Published: 8 October 2015
PDF: 5 pages
Proc. SPIE 9677, AOPC 2015: Optical Test, Measurement, and Equipment, 96771L (8 October 2015); doi: 10.1117/12.2199699
Show Author Affiliations
Xinke Xu, Harbin Institute of Technology (China)
Guodong Liu, Harbin Institute of Technology (China)
Bingguo Liu, Harbin Institute of Technology (China)
Fengdong Chen, Harbin Institute of Technology (China)
Zhitao Zhuang, Harbin Institute of Technology (China)
Yu Gan, Harbin Institute of Technology (China)
Cheng Lu, Harbin Institute of Technology (China)


Published in SPIE Proceedings Vol. 9677:
AOPC 2015: Optical Test, Measurement, and Equipment
Sen Han; Jonathan D. Ellis; Junpeng Guo; Yongcai Guo, Editor(s)

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