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Proceedings Paper

Use test system of 100GHz photodetector waveform calibrate rise time of oscilloscope
Author(s): Jianwei Li; Nan Xu; Haiyong Gan; Zhixin Zhang; Molin Zhang
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Paper Abstract

Electrooptic sampling has been shown to be a very powerful technique for making time-domain measurements of fast electronic devices and circuits, such as oscilloscope. In this paper, we review the principles of electrooptic sampling technique for electronic waveform probing with applications to characterizing 100GHz photodetector pulse response.

Paper Details

Date Published: 8 October 2015
PDF: 4 pages
Proc. SPIE 9677, AOPC 2015: Optical Test, Measurement, and Equipment, 96771A (8 October 2015); doi: 10.1117/12.2199651
Show Author Affiliations
Jianwei Li, Nankai Univ. (China)
Nan Xu, Nankai Univ. (China)
Haiyong Gan, Nankai Univ. (China)
Zhixin Zhang, Nankai Univ. (China)
Molin Zhang, Nankai Univ. (China)

Published in SPIE Proceedings Vol. 9677:
AOPC 2015: Optical Test, Measurement, and Equipment
Sen Han; Jonathan D. Ellis; Junpeng Guo; Yongcai Guo, Editor(s)

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