Share Email Print

Proceedings Paper

Compound simulator IR radiation characteristics test and calibration
Author(s): Yanhong Li; Li Zhang; Fan Li; Yi Tian; Yang Yang; Zhuo Li; Rui Shi
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

The Hardware-in-the-loop simulation can establish the target/interference physical radiation and interception of product flight process in the testing room. In particular, the simulation of environment is more difficult for high radiation energy and complicated interference model. Here the development in IR scene generation produced by a fiber array imaging transducer with circumferential lamp spot sources is introduced. The IR simulation capability includes effective simulation of aircraft signatures and point-source IR countermeasures. Two point-sources as interference can move in two-dimension random directions. For simulation the process of interference release, the radiation and motion characteristic is tested. Through the zero calibration for optical axis of simulator, the radiation can be well projected to the product detector. The test and calibration results show the new type compound simulator can be used in the hardware-in-the-loop simulation trial.

Paper Details

Date Published: 8 October 2015
PDF: 6 pages
Proc. SPIE 9677, AOPC 2015: Optical Test, Measurement, and Equipment, 967714 (8 October 2015); doi: 10.1117/12.2199527
Show Author Affiliations
Yanhong Li, Shanghai Electro-Mechanical Engineering Institute (China)
Li Zhang, Shanghai Electro-Mechanical Engineering Institute (China)
Fan Li, Shanghai Electro-Mechanical Engineering Institute (China)
Yi Tian, Shanghai Electro-Mechanical Engineering Institute (China)
Yang Yang, Shanghai Electro-Mechanical Engineering Institute (China)
Zhuo Li, Beijing Institute of Technology (China)
Rui Shi, Beijing Institute of Technology (China)

Published in SPIE Proceedings Vol. 9677:
AOPC 2015: Optical Test, Measurement, and Equipment
Sen Han; Jonathan D. Ellis; Junpeng Guo; Yongcai Guo, Editor(s)

© SPIE. Terms of Use
Back to Top