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Proceedings Paper

Improvement of specular gloss instrumentation and standard
Author(s): Dejin Yin; Lei Lai; Ming Xia; Tiecheng Li; Fangsheng Lin; Biyong Huang; Weihai Cheng
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Paper Abstract

A reference goniophotometer and primary standards for specular gloss established at the SIMT have been described, as well as the theory and measurement equations relevant to the measurements. The instrumentation, standards, and measurement techniques used to measure specular gloss have been described, including the illuminator, goniometer, receiver, sample-holding system and the characterization of the instrument. The new primary specular gloss standard and its characterization are presented.

Paper Details

Date Published: 8 October 2015
PDF: 8 pages
Proc. SPIE 9677, AOPC 2015: Optical Test, Measurement, and Equipment, 967713 (8 October 2015); doi: 10.1117/12.2199506
Show Author Affiliations
Dejin Yin, Shanghai Institute of Measurement and Testing Technology (China)
Lei Lai, Shanghai Institute of Measurement and Testing Technology (China)
Ming Xia, Shanghai Institute of Measurement and Testing Technology (China)
Tiecheng Li, Shanghai Institute of Measurement and Testing Technology (China)
Fangsheng Lin, Shanghai Institute of Measurement and Testing Technology (China)
Biyong Huang, Shanghai Institute of Measurement and Testing Technology (China)
Weihai Cheng, Shanghai Institute of Measurement and Testing Technology (China)


Published in SPIE Proceedings Vol. 9677:
AOPC 2015: Optical Test, Measurement, and Equipment
Sen Han; Jonathan D. Ellis; Junpeng Guo; Yongcai Guo, Editor(s)

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