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Proceedings Paper

The development of large-aperture test system of infrared camera and visible CCD camera
Author(s): Yingwen Li; Anbing Geng; Bo Wang; Haitao Wang; Yanying Wu
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Paper Abstract

Infrared camera and CCD camera dual-band imaging system is used in many equipment and application widely. If it is tested using the traditional infrared camera test system and visible CCD test system, 2 times of installation and alignment are needed in the test procedure. The large-aperture test system of infrared camera and visible CCD camera uses the common large-aperture reflection collimator, target wheel, frame-grabber, computer which reduces the cost and the time of installation and alignment. Multiple-frame averaging algorithm is used to reduce the influence of random noise. Athermal optical design is adopted to reduce the change of focal length location change of collimator when the environmental temperature is changing, and the image quality of the collimator of large field of view and test accuracy are also improved. Its performance is the same as that of the exotic congener and is much cheaper. It will have a good market.

Paper Details

Date Published: 15 October 2015
PDF: 6 pages
Proc. SPIE 9674, AOPC 2015: Optical and Optoelectronic Sensing and Imaging Technology, 967416 (15 October 2015); doi: 10.1117/12.2199343
Show Author Affiliations
Yingwen Li, Huazhong Research Institute of Optronic Technology (China)
Anbing Geng, Huazhong Research Institute of Optronic Technology (China)
Bo Wang, Huazhong Research Institute of Optronic Technology (China)
Haitao Wang, Huazhong Research Institute of Optronic Technology (China)
Yanying Wu, Huazhong Research Institute of Optronic Technology (China)


Published in SPIE Proceedings Vol. 9674:
AOPC 2015: Optical and Optoelectronic Sensing and Imaging Technology
Haimei Gong; Nanjian Wu; Yang Ni; Weibiao Chen; Jin Lu, Editor(s)

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