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Proceedings Paper

A measurement methodology for dynamic angle of sight errors in hardware-in-the-loop simulation
Author(s): Wen-pan Zhang; Jun-hui Wu; Lin Gan; Hong-peng Zhao; Wei-wei Liang
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Paper Abstract

In order to precisely measure dynamic angle of sight for hardware-in-the-loop simulation, a dynamic measurement methodology was established and a set of measurement system was built. The errors and drifts, such as synchronization delay, CCD measurement error and drift, laser spot error on diffuse reflection plane and optics axis drift of laser, were measured and analyzed. First, by analyzing and measuring synchronization time between laser and time of controlling data, an error control method was devised and lowered synchronization delay to 21μs. Then, the relationship between CCD device and laser spot position was calibrated precisely and fitted by two-dimension surface fitting. CCD measurement error and drift were controlled below 0.26mrad. Next, angular resolution was calculated, and laser spot error on diffuse reflection plane was estimated to be 0.065mrad. Finally, optics axis drift of laser was analyzed and measured which did not exceed 0.06mrad. The measurement results indicate that the maximum of errors and drifts of the measurement methodology is less than 0.275mrad. The methodology can satisfy the measurement on dynamic angle of sight of higher precision and lager scale.

Paper Details

Date Published: 8 October 2015
PDF: 7 pages
Proc. SPIE 9677, AOPC 2015: Optical Test, Measurement, and Equipment, 96770T (8 October 2015); doi: 10.1117/12.2199077
Show Author Affiliations
Wen-pan Zhang, Luoyang Electronic Equipment Test Ctr. (China)
Jun-hui Wu, Luoyang Electronic Equipment Test Ctr. (China)
Lin Gan, Luoyang Electronic Equipment Test Ctr. (China)
Hong-peng Zhao, Luoyang Electronic Equipment Test Ctr. (China)
Wei-wei Liang, Luoyang Electronic Equipment Test Ctr. (China)


Published in SPIE Proceedings Vol. 9677:
AOPC 2015: Optical Test, Measurement, and Equipment
Sen Han; Jonathan D. Ellis; Junpeng Guo; Yongcai Guo, Editor(s)

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