Share Email Print

Proceedings Paper

Accurate time delay technology in simulated test for high precision laser range finder
Author(s): Zhibin Chen; Wenjian Xiao; Weiming Wang; Mingxi Xue
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

With the continuous development of technology, the ranging accuracy of pulsed laser range finder (LRF) is higher and higher, so the maintenance demand of LRF is also rising. According to the dominant ideology of "time analog spatial distance" in simulated test for pulsed range finder, the key of distance simulation precision lies in the adjustable time delay. By analyzing and comparing the advantages and disadvantages of fiber and circuit delay, a method was proposed to improve the accuracy of the circuit delay without increasing the count frequency of the circuit. A high precision controllable delay circuit was designed by combining the internal delay circuit and external delay circuit which could compensate the delay error in real time. And then the circuit delay accuracy could be increased. The accuracy of the novel circuit delay methods proposed in this paper was actually measured by a high sampling rate oscilloscope actual measurement. The measurement result shows that the accuracy of the distance simulated by the circuit delay is increased from ± 0.75m up to ± 0.15m. The accuracy of the simulated distance is greatly improved in simulated test for high precision pulsed range finder.

Paper Details

Date Published: 8 October 2015
PDF: 6 pages
Proc. SPIE 9677, AOPC 2015: Optical Test, Measurement, and Equipment, 96770Q (8 October 2015); doi: 10.1117/12.2199041
Show Author Affiliations
Zhibin Chen, Ordnance Engineering College (China)
Wenjian Xiao, Ordnance Engineering College (China)
Weiming Wang, Shijiazhuang Tiedao Univ. (China)
Mingxi Xue, Ordnance Engineering College (China)

Published in SPIE Proceedings Vol. 9677:
AOPC 2015: Optical Test, Measurement, and Equipment
Sen Han; Jonathan D. Ellis; Junpeng Guo; Yongcai Guo, Editor(s)

© SPIE. Terms of Use
Back to Top