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Proceedings Paper

A method to diagnose and combat index of refraction non-uniformity in evaporative optical coatings
Author(s): Joel Bagwell; Chris Cook; Craig Ament
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Paper Abstract

In an optical coating, the thin film engineer must control film thickness and index of refraction to achieve high optical coating performance. While film thickness can generally be controlled with sweeps, sources, and distribution shields, index can be a tougher problem to solve. Often times, contaminants affect the index of refraction of a thin film and cause variations within different portions of the coating chamber leading to poor yield. Presented here is a methodology and case study used to diagnose index of refraction non-uniformity as well as identify the potential sources of contaminants in the system using a combination of Residual Gas Analysis and Secondary Ion Mass Spectrometry.

Paper Details

Date Published: 11 October 2015
PDF: 10 pages
Proc. SPIE 9633, Optifab 2015, 963310 (11 October 2015); doi: 10.1117/12.2197929
Show Author Affiliations
Joel Bagwell, Edmund Optics Inc. (United States)
Chris Cook, Edmund Optics Inc. (United States)
Craig Ament, Edmund Optics Inc. (United States)

Published in SPIE Proceedings Vol. 9633:
Optifab 2015
Julie L. Bentley; Sebastian Stoebenau, Editor(s)

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