Share Email Print
cover

Proceedings Paper

Bidirectional phase-shifting point diffraction interferometer for wavefronts testing
Author(s): Sanbin Chen; Shouhuan Zhou; Xiaojun Tang; Zhao Hong
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

The wavefront of the laser beam was tested by a point-diffraction interferometer with bidirectional phase-shifting. The phase-shifting is obtained by the bidirectional modulated of the electro-optic effect lithium niobate crystal combining with a pinhole filter in half-wave film. The wavefront aberration of incoming beam is directly measured by analyzing five frames phase-shifted interferograms captured by a CCD camera.

Paper Details

Date Published: 8 October 2015
PDF: 9 pages
Proc. SPIE 9677, AOPC 2015: Optical Test, Measurement, and Equipment, 96770M (8 October 2015); doi: 10.1117/12.2197812
Show Author Affiliations
Sanbin Chen, North China Research Institute of Electro-optics (China)
Shouhuan Zhou, North China Research Institute of Electro-optics (China)
Xiaojun Tang, North China Research Institute of Electro-optics (China)
Zhao Hong, North China Research Institute of Electro-optics (China)


Published in SPIE Proceedings Vol. 9677:
AOPC 2015: Optical Test, Measurement, and Equipment
Sen Han; Jonathan D. Ellis; Junpeng Guo; Yongcai Guo, Editor(s)

© SPIE. Terms of Use
Back to Top