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Proceedings Paper

Study on the infrared radiation characteristics of the sky background
Author(s): Yong Chen; Dong Wang; Ming Shao
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Paper Abstract

The sky background infrared radiation characteristic is of great significance to target detection and extraction is of great significance. Using 3~5 micron medium wave, 8~12 microns long wave infrared measuring equipment has carried on the long-term measure to the sky background infrared radiation intensity. In this paper, the difference of the sky background infrared radiation brightness was contrast researched between the cloudless fine weather and cloudy sky of foggy weather, the influence was also analyzed of the different observation angles, the sun position and atmospheric temperature on the sky background radiation. The research results show that the infrared radiation intensity in the cloudy sky background under foggy weather is greater than in the cloudless weather clear sky, background infrared radiation intensity of long wave under the condition of same sky background radiation luminance brightness is higher than that of bilateral radiation. As the observation Angle increases, the sky background radiation intensity decreased significantly, and the decreased amplitude of sky background radiation brightness is higher under small angle than under large angle. At the same time, the factors such as solar radiation, air temperature also have a great influence on the sky background radiation. The researched result will be useful to the infrared target detection and indentification.

Paper Details

Date Published: 8 October 2015
PDF: 5 pages
Proc. SPIE 9678, AOPC 2015: Telescope and Space Optical Instrumentation, 96780D (8 October 2015); doi: 10.1117/12.2197797
Show Author Affiliations
Yong Chen, Luoyang Electronic Equipment Test Ctr. (China)
Dong Wang, Luoyang Electronic Equipment Test Ctr. (China)
Ming Shao, Luoyang Electronic Equipment Test Ctr. (China)


Published in SPIE Proceedings Vol. 9678:
AOPC 2015: Telescope and Space Optical Instrumentation
Bin Xiangli; Dae Wook Kim; Suijian Xue, Editor(s)

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